{"product_id":"high-resolution-x-ray-diffractometry-and-topography-9780367400637","title":"High Resolution X-Ray Diffractometry And Topography","description":"The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization.\u003cbr\u003e","brand":"CRC Press","offers":[{"title":"Default Title","offer_id":50859080941842,"sku":"9780367400637","price":94.99,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0831\/4771\/8930\/files\/img_85ff0a1d-36a1-4a29-bccf-56cbaa382713.jpg?v=1737549209","url":"https:\/\/surprise-castle.myshopify.com\/products\/high-resolution-x-ray-diffractometry-and-topography-9780367400637","provider":"Surprise Castle","version":"1.0","type":"link"}